Fault grading
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Fault grading is a procedure that rates testability by relating the number of fabrication defects that can in fact be detected with a test vector set under consideration to the total number of conceivable faults. It is used for refining both the test circuitry and the test patterns iteratively, until a satisfactory fault coverage is obtained.
Fault grading is a procedure that rates testability by relating the number of fabrication defects that can in fact be detected with a test vector set under consideration to the total number of conceivable faults. It is used for refining both the test circuitry and the test patterns iteratively, until a satisfactory fault coverage is obtained. ==See also== Automatic test pattern generation Design for Test ==References==
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